Details
TitleGuilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
AuthorsAkito Monden
 Satoshi Okahara
 Yuki Manabe
 Ken-ichi Matsumoto
ReferenceIEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.
Typearticle
 ʸ
DateMar/1/2011
ReviewReviewed
Date of RegisterApr/6/2011
Number829
URL http://www.computer.org/portal/web/csdl/doi/10.1109/MS.2010.159
Society nameIEEE
FilesAdobe PDF Document

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