Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
| 題名 | Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations |
|---|---|
| 著者 | Akito Monden, Satoshi Okahara, Yuki Manabe, Ken-ichi Matsumoto |
| 文献 | IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011. |
| 種類 | article / 論文 |
| 日付 | 2011年3月1日 |
| 査読 | 査読付き |
| 登録日 | 2011年4月6日 |
| 番号 | 829 |
| URL | http://www.computer.org/portal/web/csdl/doi/10.1109/MS.2010.159 |
| 学会名 | IEEE |
| ファイル | |
| 引用形式 | @article{2011ID829,
author = {Monden, Akito and Okahara, Satoshi and Manabe, Yuki and Matsumoto, Ken-ichi},
journal = {IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.},
year = {2011},
month = {mar 1},
title = {Guilty or {Not} {Guilty}: Using {Clone} {Metrics} to {Determine} {Open} {Source} {Licensing} {Violations}},
}
|