Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
Title | Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations |
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Authors | Akito Monden, Satoshi Okahara, Yuki Manabe, Ken-ichi Matsumoto |
Reference | IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011. |
Type | article / 論文 |
Date | Mar 1, 2011 |
Review | Reviewed |
Date of register | Apr 6, 2011 |
ID | 829 |
URL | http://www.computer.org/portal/web/csdl/doi/10.1109/MS.2010.159 |
Society name | IEEE |
Files | |
Citation | @article{2011ID829, author = {Monden, Akito and Okahara, Satoshi and Manabe, Yuki and Matsumoto, Ken-ichi}, journal = {IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.}, year = {2011}, month = {mar 1}, title = {Guilty or {Not} {Guilty}: Using {Clone} {Metrics} to {Determine} {Open} {Source} {Licensing} {Violations}}, } |