Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
題名 | Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations |
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著者 | Akito Monden, Satoshi Okahara, Yuki Manabe, Ken-ichi Matsumoto |
文献 | IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011. |
種類 | article / 論文 |
日付 | 2011年3月1日 |
査読 | 査読付き |
登録日 | 2011年4月6日 |
番号 | 829 |
URL | http://www.computer.org/portal/web/csdl/doi/10.1109/MS.2010.159 |
学会名 | IEEE |
ファイル | |
引用形式 | @article{2011ID829, author = {Monden, Akito and Okahara, Satoshi and Manabe, Yuki and Matsumoto, Ken-ichi}, journal = {IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.}, year = {2011}, month = {mar 1}, title = {Guilty or {Not} {Guilty}: Using {Clone} {Metrics} to {Determine} {Open} {Source} {Licensing} {Violations}}, } |