Token Comparison Approach to Detect Code Clone-related Bugs
Title | Token Comparison Approach to Detect Code Clone-related Bugs |
---|---|
Authors | Yii Yong Lee, Yasuhiro Hayase, Makoto Matsushita, Katsuro Inoue |
Reference | 電子情報通信学会技術研究報告, SS2007-57〜75, Vol.107, No.505, pp.37-42, 2008. |
Type | report / 研究会 |
Date | Mar 3, 2008 |
Presenter | Yii Yong Lee |
Agenda of conference | Feb 2008 |
Place of conference | 長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室 |
ID | 689 |
URL | http://www.ieice.org/ken/program/?tgid=SS&tgs_regid=8eb28d92a32fac54781ff926cd9225701baab249f8decec8f5f377265947c894 |
Society name | 電子情報通信学会 |
Files | |
Citation | @techreport{2008ID689, author = {Lee, Yii Yong and Hayase, Yasuhiro and Matsushita, Makoto and Inoue, Katsuro}, year = {2008}, month = {mar 3}, title = {Token {Comparison} {Approach} to {Detect} {Code} {Clone}-related {Bugs}}, } |