Details
TitleToken Comparison Approach to Detect Code Clone-related Bugs
AuthorsYii Yong Lee
 Yasuhiro Hayase
 Makoto Matsushita
 Katsuro Inoue
Bibliography電子情報通信学会技術研究報告, SS2007-57〜75, Vol.107, No.505, pp.37-42, 2008.
TypeDomestic Conference
DateMarch 3, 2008
ReviewNot Reviewed
PresenterYii Yong Lee
Conference ScheduleMarch 3-4, 2008
Conference Venue長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室
Number689
URLhttp://www.ieice.org/ken/program/?tgid=SS&tgs_regid=8eb28d92a32fac54781ff926cd9225701baab249f8decec8f5f377265947c894
Society Name電子情報通信学会
FilesAdobe PDF DocumentPowerPoint Presentation
BibTeX
@inproceedings{sel689,
    author = {Yii Yong Lee and Yasuhiro Hayase and Makoto Matsushita and Katsuro Inoue},
    title = {{Token Comparison Approach to Detect Code Clone-related Bugs}},
    booktitle = {電子情報通信学会技術研究報告, SS2007-57〜75, Vol.107, No.505, pp.37-42, 2008.},
    address = {長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室},
    year = 2008,
    month = mar,
}

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