Detail

Title Token Comparison Approach to Detect Code Clone-related Bugs

Authors Yii Yong Lee, Yasuhiro Hayase, Makoto Matsushita, Katsuro Inoue

Bibliography 電子情報通信学会技術研究報告, SS2007-57〜75, Vol.107, No.505, pp.37-42, 2008.

Type Domestic Conference

Date March 3, 2008

Review Not Reviewed

Presenters Yii Yong Lee

Conference Schedule From March 3-4, 2008 to

Conference Venue 長崎大学文教キャンパス総合研究教育棟1階 108番講義室

Registration Date

Notes

Number 689

URL http://www.ieice.org/ken/program/?tgid=SS&tgs_regid=8eb28d92a32fac54781ff926cd9225701baab249f8decec8f5f377265947c894

DOI

ISBN

ISSN

Society Name 電子情報通信学会

Files

BibTeX

@inproceedings{sel689,
    author = {Yii Yong Lee and Yasuhiro Hayase and Makoto Matsushita and Katsuro Inoue},
    title = {{Token Comparison Approach to Detect Code Clone-related Bugs}},
    booktitle = {電子情報通信学会技術研究報告, SS2007-57〜75, Vol.107, No.505, pp.37-42, 2008.},
    address = {長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室},
    year = 2008,
    month = mar,
}

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