Details | |
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Title | Token Comparison Approach to Detect Code Clone-related Bugs |
Authors | Yii Yong Lee |
Yasuhiro Hayase | |
Makoto Matsushita | |
Katsuro Inoue | |
Bibliography | 電子情報通信学会技術研究報告, SS2007-57〜75, Vol.107, No.505, pp.37-42, 2008. |
Type | Domestic Conference |
Date | March 3, 2008 |
Review | Not Reviewed |
Presenter | Yii Yong Lee |
Conference Schedule | March 3-4, 2008 |
Conference Venue | 長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室 |
Number | 689 |
URL | http://www.ieice.org/ken/program/?tgid=SS&tgs_regid=8eb28d92a32fac54781ff926cd9225701baab249f8decec8f5f377265947c894 |
Society Name | 電子情報通信学会 |
Files | ![]() ![]() |
BibTeX | @inproceedings{sel689, author = {Yii Yong Lee and Yasuhiro Hayase and Makoto Matsushita and Katsuro Inoue}, title = {{Token Comparison Approach to Detect Code Clone-related Bugs}}, booktitle = {電子情報通信学会技術研究報告, SS2007-57〜75, Vol.107, No.505, pp.37-42, 2008.}, address = {長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室}, year = 2008, month = mar, } |