Details
TitleRetrieving Similar Code Fragments based on Identifier Similarity for Defect Detection
AuthorsNorihiro Yoshida
 Takashi Ishio
 Makoto Matsushita
 Katsuro Inoue
BibliographyProceedings of International Workshop on Defects in Large Software Systems (DEFECTS 2008), pp.41-42, 2008
TypeInternational Conference
DateJuly 20, 2008
ReviewReviewed
PresenterNorihiro Yoshida
Conference ScheduleJuly 20, 2008
Conference VenueSeattle, USA
NotesCo-located with ISSTA 2008
Number706
URLhttp://pages.cpsc.ucalgary.ca/~zimmerth/defects-2008/
Society NameACM
FilesAdobe PDF DocumentPowerPoint Presentation
BibTeX
@inproceedings{sel706,
    author = {Norihiro Yoshida and Takashi Ishio and Makoto Matsushita and Katsuro Inoue},
    title = {{Retrieving Similar Code Fragments based on Identifier Similarity for Defect Detection}},
    booktitle = {Proceedings of International Workshop on Defects in Large Software Systems (DEFECTS 2008), pp.41-42, 2008},
    address = {Seattle, USA},
    year = 2008,
    month = jul,
}

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