Detail

Title Retrieving Similar Code Fragments based on Identifier Similarity for Defect Detection

Authors Norihiro Yoshida, Takashi Ishio, Makoto Matsushita, Katsuro Inoue

Bibliography Proceedings of International Workshop on Defects in Large Software Systems (DEFECTS 2008), pp.41-42, 2008

Type International Conference

Date July 20, 2008

Review Reviewed

Presenters Norihiro Yoshida

Conference Schedule From July 20, 2008 to

Conference Venue Seattle, USA

Registration Date

Notes Co-located with ISSTA 2008

Number 706

URL http://pages.cpsc.ucalgary.ca/~zimmerth/defects-2008/

DOI

ISBN

ISSN

Society Name ACM

Files

BibTeX

@inproceedings{sel706,
    author = {Norihiro Yoshida and Takashi Ishio and Makoto Matsushita and Katsuro Inoue},
    title = {{Retrieving Similar Code Fragments based on Identifier Similarity for Defect Detection}},
    booktitle = {Proceedings of International Workshop on Defects in Large Software Systems (DEFECTS 2008), pp.41-42, 2008},
    address = {Seattle, USA},
    year = 2008,
    month = jul,
}

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