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Finding Similar Defects Using Synonymous Identifier Retrieval

TitleFinding Similar Defects Using Synonymous Identifier Retrieval
AuthorsNorihiro Yoshida, Takeshi Hattori, Katsuro Inoue
ReferenceProceedings of the 4th International Workshop on Software Clones, pp.49-56
Typeinproceeding / 国際会議録
DateMay 8, 2010
ReviewReviewed
PresenterNorihiro Yoshida
Agenda of conferenceMay 8, 2010
Place of conferenceCape Town International Convention Centre, Cape Town, South Africa
ID800
URLhttp://iwsc2010.ist.osaka-u.ac.jp/
Society nameACM
Files
NoteIn association with ICSE 2010
Citation
@inproceedings{2010ID800,
	author = {Yoshida, Norihiro and Hattori, Takeshi and Inoue, Katsuro},
	booktitle = {Proceedings of the 4th {International} {Workshop} on {Software} {Clones}, pp.49-56},
	year = {2010},
	month = {may 8},
	title = {Finding {Similar} {Defects} {Using} {Synonymous} {Identifier} {Retrieval}},
}