| Details | |
|---|---|
| Title | Finding Similar Defects Using Synonymous Identifier Retrieval |
| Authors | Norihiro Yoshida |
| Takeshi Hattori | |
| Katsuro Inoue | |
| Bibliography | Proceedings of the 4th International Workshop on Software Clones, pp.49-56 |
| Type | International Conference |
| Date | May 8, 2010 |
| Review | Reviewed |
| Presenter | Norihiro Yoshida |
| Conference Schedule | May 8, 2010 |
| Conference Venue | Cape Town International Convention Centre, Cape Town, South Africa |
| Notes | In association with ICSE 2010 |
| Number | 800 |
| URL | http://iwsc2010.ist.osaka-u.ac.jp/ |
| Society Name | ACM |
| Files |   |
| BibTeX | @inproceedings{sel800,
author = {Norihiro Yoshida and Takeshi Hattori and Katsuro Inoue},
title = {{Finding Similar Defects Using Synonymous Identifier Retrieval}},
booktitle = {Proceedings of the 4th International Workshop on Software Clones, pp.49-56},
address = {Cape Town International Convention Centre, Cape Town, South Africa},
year = 2010,
month = may,
}
|