Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
| Title | Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations |
|---|---|
| Authors | Akito Monden, Satoshi Okahara, Yuki Manabe, Ken-ichi Matsumoto |
| Reference | IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011. |
| Type | article / 論文 |
| Date | Mar 1, 2011 |
| Review | Reviewed |
| Date of register | Apr 6, 2011 |
| ID | 829 |
| URL | http://www.computer.org/portal/web/csdl/doi/10.1109/MS.2010.159 |
| Society name | IEEE |
| Files | |
| Citation | @article{2011ID829,
author = {Monden, Akito and Okahara, Satoshi and Manabe, Yuki and Matsumoto, Ken-ichi},
journal = {IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.},
year = {2011},
month = {mar 1},
title = {Guilty or {Not} {Guilty}: Using {Clone} {Metrics} to {Determine} {Open} {Source} {Licensing} {Violations}},
}
|