Detail

Title Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations

Authors Akito Monden, Satoshi Okahara, Yuki Manabe, Ken-ichi Matsumoto

Bibliography IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.

Type Paper

Date March 1, 2011

Review Reviewed

Presenters

Conference Schedule From to

Conference Venue

Registration Date April 6, 2011

Notes

Number 829

URL

DOI 10.1109/MS.2010.159

ISBN

ISSN

Society Name IEEE

Files

BibTeX

@article{sel829,
    author = {Akito Monden and Satoshi Okahara and Yuki Manabe and Ken-ichi Matsumoto},
    title = {{Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations}},
    journal = {IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.},
    doi = {10.1109/MS.2010.159},
    year = 2011,
    month = mar,
}

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