Detail
Title
Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
Authors
Akito Monden, Satoshi Okahara, Yuki Manabe, Ken-ichi Matsumoto
Bibliography
IEEE Software, Special Issue on Software Protection, Vol. 28, No. 2, pp. 42-47
Type
Paper
Date
March 1, 2011
Review
Reviewed
Presenters
Conference Schedule
From to
Conference Venue
Registration Date
April 6, 2011
Notes
Number
829
DOI
10.1109/MS.2010.159
ISBN
ISSN
Society Name
IEEE
BibTeX
@article{sel829,
author = {Akito Monden and Satoshi Okahara and Yuki Manabe and Ken-ichi Matsumoto},
title = {{Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations}},
journal = {IEEE Software, Special Issue on Software Protection},
volume = {28},
number = {2},
pages = {42--47},
doi = {10.1109/MS.2010.159},
year = 2011,
month = mar,
}