| Details | |
|---|---|
| Title | Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations |
| Authors | Akito Monden |
| Satoshi Okahara | |
| Yuki Manabe | |
| Ken-ichi Matsumoto | |
| Bibliography | IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011. |
| Type | Paper |
| Date | March 1, 2011 |
| Review | Reviewed |
| Registration Date | April 6, 2011 |
| Number | 829 |
| DOI | 10.1109/MS.2010.159 |
| Society Name | IEEE |
| Files |  |
| BibTeX | @article{sel829,
author = {Akito Monden and Satoshi Okahara and Yuki Manabe and Ken-ichi Matsumoto},
title = {{Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations}},
journal = {IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.},
doi = {10.1109/MS.2010.159},
year = 2011,
month = mar,
}
|