Details
TitleOn the Effectiveness of Accuracy of Automated Feature Location Technique
AuthorsTakashi Ishio
 Shinpei Hayashi
 Hiroshi Kazato
 Tsuyoshi Oshima
ReferenceProceedings of the 20th IEEE Working Conference on Reverse Engineering, pp.381-390
Typeinproceeding
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DateOct/14/2013
ReviewReviewed
PresenterTakashi Ishio
Agenda of conferenceOct/14-17/2013
Place of conferenceUniversity of Koblenz-Lindau, Koblenz, Germany
Date of RegisterOct/24/2013
NoteThe dataset of the paper is available at http://sel.ist.osaka-u.ac.jp/FL/
Number908
URL http://wcre.wikidot.com/2013
Society nameIEEE
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