Detail
Title
Token Comparison Approach to Detect Code Clone-related Bugs
Authors
Yii Yong Lee, Yasuhiro Hayase, Makoto Matsushita, Katsuro Inoue
Bibliography
電子情報通信学会技術研究報告, SS2007-57〜75, Vol. 107, No. 505, pp. 37-42
Type
Domestic Conference
Date
March 3, 2008
Review
Not Reviewed
Presenters
Yii Yong Lee
Conference Schedule
From March, 2008 to
Conference Venue
長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室
Registration Date
Notes
Number
689
DOI
ISBN
ISSN
Society Name
電子情報通信学会
BibTeX
@inproceedings{sel689,
author = {Yii Yong Lee and Yasuhiro Hayase and Makoto Matsushita and Katsuro Inoue},
title = {{Token Comparison Approach to Detect Code Clone-related Bugs}},
booktitle = {電子情報通信学会技術研究報告, SS2007-57〜75},
volume = {107},
number = {505},
pages = {37--42},
address = {長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室},
year = 2008,
month = mar,
}