Detail

Title Token Comparison Approach to Detect Code Clone-related Bugs
Authors Yii Yong Lee, Yasuhiro Hayase, Makoto Matsushita, Katsuro Inoue
Bibliography 電子情報通信学会技術研究報告, SS2007-57〜75, Vol. 107, No. 505, pp. 37-42
Type Domestic Conference
Date March 3, 2008
Review Not Reviewed
Presenters Yii Yong Lee
Conference Schedule From March, 2008 to
Conference Venue 長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室
Registration Date
Notes
Number 689
DOI
ISBN
ISSN
Society Name 電子情報通信学会
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BibTeX
@inproceedings{sel689,
    author = {Yii Yong Lee and Yasuhiro Hayase and Makoto Matsushita and Katsuro Inoue},
    title = {{Token Comparison Approach to Detect Code Clone-related Bugs}},
    booktitle = {電子情報通信学会技術研究報告, SS2007-57〜75},
    volume = {107},
    number = {505},
    pages = {37--42},
    address = {長崎大学 文教キャンパス 総合研究教育棟1階 108番講義室},
    year = 2008,
    month = mar,
}

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