HIGO LAB
Detail
Title
Finding Similar Defects Using Synonymous Identifier Retrieval
Authors
Norihiro Yoshida, Takeshi Hattori, Katsuro Inoue
Bibliography
Proceedings of the 4th International Workshop on Software Clones, pp.49-56
Type
International Conference
Date
May 8,
Review
Reviewed
Presenters
Norihiro Yoshida
Conference Schedule
From May 8,
Conference Venue
Cape Town International Convention Centre, Cape Town, South Africa
Registration Date
Notes
In association with ICSE 2010
Number
800
DOI
ISBN
ISSN
Society Name
ACM
Files
BibTeX
@inproceedings{sel800,
author = {Norihiro Yoshida and Takeshi Hattori and Katsuro Inoue},
title = {{Finding Similar Defects Using Synonymous Identifier Retrieval}},
booktitle = {Proceedings of the 4th International Workshop on Software Clones, pp.49-56},
address = {Cape Town International Convention Centre, Cape Town, South Africa},
year = 2010,
month = may,
}