詳細
題名Retrieving Similar Code Fragments based on Identifier Similarity for Defect Detection
著者Norihiro Yoshida
 Takashi Ishio
 Makoto Matsushita
 Katsuro Inoue
文献Proceedings of International Workshop on Defects in Large Software Systems (DEFECTS 2008), pp.41-42, 2008
種別国際会議
日付2008年7月20日
査読査読付き
登壇発表者Norihiro Yoshida
会議の日程2008年7月20日
会議の開催場所Seattle, USA
備考Co-located with ISSTA 2008
番号706
URLhttp://pages.cpsc.ucalgary.ca/~zimmerth/defects-2008/
学会名ACM
ファイルAdobe PDF DocumentPowerPoint Presentation
BibTeX
@inproceedings{sel706,
    author = {Norihiro Yoshida and Takashi Ishio and Makoto Matsushita and Katsuro Inoue},
    title = {{Retrieving Similar Code Fragments based on Identifier Similarity for Defect Detection}},
    booktitle = {Proceedings of International Workshop on Defects in Large Software Systems (DEFECTS 2008), pp.41-42, 2008},
    address = {Seattle, USA},
    year = 2008,
    month = jul,
}

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