詳細
題名Finding Similar Defects Using Synonymous Identifier Retrieval
著者Norihiro Yoshida
 Takeshi Hattori
 Katsuro Inoue
文献Proceedings of the 4th International Workshop on Software Clones, pp.49-56
種別国際会議
日付2010年5月8日
査読査読付き
登壇発表者Norihiro Yoshida
会議の日程2010年5月8日
会議の開催場所Cape Town International Convention Centre, Cape Town, South Africa
備考In association with ICSE 2010
番号800
URLhttp://iwsc2010.ist.osaka-u.ac.jp/
学会名ACM
ファイルAdobe PDF DocumentPowerPoint Presentation
BibTeX
@inproceedings{sel800,
    author = {Norihiro Yoshida and Takeshi Hattori and Katsuro Inoue},
    title = {{Finding Similar Defects Using Synonymous Identifier Retrieval}},
    booktitle = {Proceedings of the 4th International Workshop on Software Clones, pp.49-56},
    address = {Cape Town International Convention Centre, Cape Town, South Africa},
    year = 2010,
    month = may,
}

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