詳細
題名Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
著者Akito Monden
 Satoshi Okahara
 Yuki Manabe
 Ken-ichi Matsumoto
文献IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.
種別論文
日付2011年3月1日
査読査読付き
登録日2011年4月6日
番号829
DOI10.1109/MS.2010.159
学会名IEEE
ファイルAdobe PDF Document
BibTeX
@article{sel829,
    author = {Akito Monden and Satoshi Okahara and Yuki Manabe and Ken-ichi Matsumoto},
    title = {{Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations}},
    journal = {IEEE Software, Special Issue on Software Protection, vol. 28, no. 2, pp. 42-47, March/April 2011.},
    doi = {10.1109/MS.2010.159},
    year = 2011,
    month = mar,
}

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